Publications

2000

• Low temperature plasma processed microcrystalline silicon thin films for large area electronics
  
  • Roca I Cabarrocas P.
  • Tripathi V.
  • Bulkin Pavel
  • Brenot Romain
  • Drévillon Bernard
  • Vanderhagen R.
  • French Ian
  , 2001, pp.361.
• Process monitoring of semiconductor thin film and interfaces by spectroellipsometry
  
  • Brenot Romain
  • Drévillon Bernard
  • Bulkin Pavel
  • Roca I Cabarrocas P.
  • Vanderhagen R.
  Applied Surface Science, Elsevier, 2000, pp.283-290.
• Numerical simulation of plasma implosion under radiative heating of the inlet hole walls of hohlraum target
  
  • Gasilov V.A.
  • Guskov S.Yu.
  • Krukovski A.Yu.
  • Novikova Tatiana
  • Rosanov V.B.
  Journal of Russian Laser Research, Springer Verlag, 2000, 21 (5), pp.465.
• Production of iron-oxide nanoparticles by laser-induced pyrolysis of gaseous precursors
  
  • Martelli S.
  • Mancini A.
  • Giorgi R.
  • Alexandrescu R.
  • Cojocaru Costel Sorin
  • Crunteanu Aurelian
  • Voicu I.
  • Balu M.
  • Morjan I.
  Applied Surface Science, Elsevier, 2000, 154-155, pp.353-359.
• Real time control of plasma deposited optical filters by multiwavelength ellipsometry
  
  • Heitz T.
  • Hofrichter A.
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2000, pp.1303.
• The Mechanical Behaviour of Plasma Deposited Silica Films on Polycarbonate and Steel
  
  • Hofrichter A.
  • Bulkin Pavel
  • Drévillon Bernard
  Le Vide, Société française du vide, 2000, pp.509-512.
• A study of the influence of a hydrogenated carbon interlayer on the adhesion properties of plasma deposited silica thin films on polycarbonate
  
  • Hofrichter A.
  • Bulkin Pavel
  • Ballutaud Dominique
  • Drévillon Bernard
  Le Vide, Société française du vide, 2000, pp.35.
• Automated electron cyclotron resonance plasma enhanced chemical vapor deposition system for the growth of rugate filters
  
  • Swart P. L.
  • Lacquet B. M.
  • Chtcherbakov A. A.
  • Bulkin Pavel
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2000, pp.74.
• Comparison of different methods of measuring 8-oxoguanine as a marker of oxidative DNA damage
  
  • Collins A. R.
  • Brown J.
  • Bogdanov M.
  • Cadet J.
  • Cooke M.
  • Douki Thierry
  • Dunster C.
  • Eakins J.
  • Epe B.
  • Evans M.
  • Farmer P.
  • Gedik C. M.
  • Halliwell B.
  • Herbert K.
  • Hofer T.
  • Hutchinson R.
  • Jenner A.
  • Jones G. D. D.
  • Kasai H.
  • Kelly F.
  • Lloret A.
  • Loft S.
  • Lunec J.
  • Mcewan M.
  • Moller L.
  • Olinski R.
  • Podmore I.
  • Poulsen H.
  • Ravanat J. L.
  • Rees J. F.
  • Reetz F.
  • Shertzer H.
  • Spiegelhalder B.
  • Turesky R.
  • Tyrrell R.
  • Vina J.
  • Vinicombe D.
  • Weimann A.
  • Wergifosse B. De
  • Wood S. G.
  Free Radical Research, Taylor & Francis, 2000, 32 (4), pp.333-341.
• Study of the mechanical behaviour of plasma deposited silica films on polycarbonates and steel
  
  • Hofrichter Alfred
  • Constantinescu Andrei
  • Benayoun Stéphane
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2000, 18, pp.2012-2014. (10.1116/1.582464)
  DOI : 10.1116/1.582464