Publications

2004

• Étude expérimentale de l'interaction de l'hydrogène atomique avec des surfaces de silicium. Réalisation du système expérimental, caractérisation et premiers résultats.
  
  • Bisson Régis
  , 2004.
• Développements instrumentaux en imagerie tomographique et polarimétrique.
  
  • Laude-Boulesteix Blandine
  , 2004.
• A new polarised hot filament chemical vapor deposition process for homogeneous diamond nucleation on Si(100)
  
  • Cojocaru Costel Sorin
  • Larijani Madjid
  • Misra D. S.
  • Singh Manoj K.
  • Veis Pavel
  • Le Normand Francois
  Diamond and Related Materials, Elsevier, 2004, 13, pp.270-276. (10.1016/j.diamond.2003.10.076)
  DOI : 10.1016/j.diamond.2003.10.076
• Caracterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry
  
  • Kaplan Bernard
  • Novikova Tatiana
  • de Martino Antonello
  • Drevillon Bernard
  Applied optics, Optical Society of America, 2004, 43 (6), pp.1233.
• Simple method of gas flow ratio optimization in high rate deposition of SiO2 by electron cyclotron resonance plasma enhanced chemical vapor deposition
  
  • Daineka D.
  • Bulkin Pavel
  • Girard Gabriel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2004, pp.36.
• Spectroscopic Mueller polarimeter based on liquid crystal devices
  
  • Garcia-Caurel Enric
  • de Martino Antonello
  • Drevillon Bernard
  Thin Solid Films, Elsevier, 2004, 455-456, pp.120.
• UV-visible sensors based on polymorphous silicon
  
  • Guedj Cyril
  • Moussy Norbert
  • Rabaud Wilfried
  • Roca I Cabarrocas Pere
  • Tchakarov Svetoslav
  • Kleider Jean-Paul
  Journal of Non-Crystalline Solids, Elsevier, 2004, 338-340, pp.749-753. (10.1016/j.jnoncrysol.2004.03.083)
  DOI : 10.1016/j.jnoncrysol.2004.03.083
• Stoichiometry and infrared absorption of amorphous a-C1-xNx : H carbon nitride films
  
  • Bouchet-Fabre B.
  • Godet C.
  • Lacerda M.
  • Charvet S.
  • Zellama K.
  • Ballutaud D.
  Journal of Applied Physics, American Institute of Physics, 2004, 95, pp.3427-3436. (10.1063/1.1650879)
  DOI : 10.1063/1.1650879
• General methods for optimized design and calibration of Mueller polarimeters
  
  • de Martino Antonello
  • Garcia-Caurel Enric
  • Laude-Bulesteix Blandine
  • Drévillon Bernard
  Thin Solid Films, Elsevier, 2004, 455-456, pp.112.
• Plasma treatments of the interface in n-type amorphous hydrogenated silicon/p-type crystalline silicon heterojunction solar cells
  
  • Damon-Lacoste J.
  • Roca I Cabarrocas Pere
  • Gudovskikh A.S.
  • Kleider J.P.
  • Ribeyron P.J.
  • Svrcek V.
  • Veschetti Y.
  , 2004, pp.Proc. Vol. 2 pp. 1453-1456.
• Polycrystalline silicon thin films on foreign substrates using AIC seed layer
  
  • Pihan É.
  • Slaoui A.
  • Focsa A.
  • Roca I Cabarrocas Pere
  • Lezec H.
  , 2004, pp.Proc. Vol. 1 pp. 1251-1254.
• Comparative study of the structure of a-CNx et a-CNx :H films using NEXAFS, XPS and FTIR analysis
  
  • Bouchet-Fabre B.
  • Zellama K.
  • Godet C.
  • Ballutaud D.
  • Minéa T.
  • Parent Ph.
  • Laffon K.
  , 2004.
• Control and monitoring of optical thin films deposition in a Matrix Distributed Electron Cyclotron Resonance reactor
  
  • Daineka D.
  • Kouznetsov D.
  • Bulkin Pavel
  • Girard Gabriel
  • Bouree J.E.
  • Drévillon Bernard
  European Physical Journal: Applied Physics, EDP Sciences, 2004, pp.343-346.
• Investigation of coupling between chemistry and discharge dynamics in Radio Frequency hydrogen plasmas in the Torr regime
  
  • Kalache Billel
  • Novikova Tatiana
  • Fontcuberta I Morral Anna
  • Roca I Cabarrocas Pere
  • Morscheidt W.
  • Hassouni Khaled
  Journal of Physics D: Applied Physics, IOP Publishing, 2004, 37 (13), pp.1765.
• Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering
  
  • Bouchet-Fabre B.
  • Marino E.
  • Lazar G.
  • Abel F.
  • Ballutaud D.
  • Godet C.
  • Zellama K.
  , 2004.
• High density plasma enhanced chemical vapor deposition of optical thin films
  
  • Daineka D.
  • Bulkin Pavel
  • Girard Gabriel
  • Bouree J.E.
  • Drévillon Bernard
  European Physical Journal: Applied Physics, EDP Sciences, 2004, pp.3-9.
• Deposition of optical coatings with real time control by the spectroellipsometry
  
  • Bulkin Pavel
  • Daineka D.
  • Kouznetsov D.
  • Drevillon Bernard
  European Physical Journal: Applied Physics, EDP Sciences, 2004, pp.235.
• Mueller polarimetric microscopy
  
  • Laude-Bulesteix Blandine
  • de Martino Antonello
  • Le Naour Gilles
  • Genestie Catherine
  • Schwartz Laurent
  • Garcia-Caurel Enric
  • Drevillon Bernard
  Proceedings of SPIE, the International Society for Optical Engineering, SPIE, The International Society for Optical Engineering, 2004, 5324, pp.112.