Publications

2008

• Wide-band reflection nanoporous silicon multilayers with ellipsometric investigation of the material monolayer components
  
  • Xifré-Pérez Elisabet
  • Garcia-Caurel Enric
  • Pallares Josep
  • Ferre-Borrull Josep
  • Marsal Lluis F.
  Materials Science and Engineering: B, Elsevier, 2008, 147, pp.205.
• Critical dimensions of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
  
  • Foldyna Martin
  • de Martino Antonello
  • Garcia-Caurel Enric
  • Ossikovski Razvigor
  • Licitra C.
  • Bertin François
  • Postava Kamil
  • Drévillon Bernard
  European Physical Journal: Applied Physics, EDP Sciences, 2008, 42, pp.351. (10.1051/epjap:2008089)
  DOI : 10.1051/epjap:2008089
• Density control of electrodeposited Ni nanoparticles/nanowires inside porous anodic alumina templates by an exponential anodization voltage decrease
  
  • Marquardt Berndt
  • Eude Laurent
  • Gowtham Manoraham
  • Cho G.
  • Jeong Hee Jeen
  • Châtelet Marc
  • Cojocaru Costel Sorin
  • Kim B. S.
  • Pribat Didier
  Nanotechnology, Institute of Physics, 2008, 19, pp.405607. (10.1088/0957-4484/19/40/405607)
  DOI : 10.1088/0957-4484/19/40/405607
• Fast near-infra-red spectroscopic Mueller matrix ellipsometer based on ferroelectric liquid crystal retarders
  
  • Ladstein J.
  • Stabo-Egg Frantz
  • Garcia-Caurel Enric
  • Kildemo Morten
  Physica Status Solidi A (applications and materials science), Wiley, 2008, 5, pp.1097.
• Advances in the deposition of microcrystalline silicon at high rate by distributed electron cyclotron resonance
  
  • Roca I Cabarrocas P.
  • Bulkin Pavel
  • Daineka D.
  • Dao T. H.
  • Leempoel P.
  • Descamps P.
  • Kervyn de Meerendré T.
  • Charliac J.
  Thin Solid Films, Elsevier, 2008, pp.6834-6838.
• Multilayer optical filters control by multi-channel kinetic ellipsometry
  
  • Haj Ibrahim Bicher
  • Botha Roelene
  • Bulkin Pavel
  • Drévillon Bernard
  Physica Status Solidi C: Current Topics in Solid State Physics, Wiley, 2008, pp.1290-1294.
• Polarimetric characterization of optically anisotropic flexible substrates
  
  • Stchakovsky Michel
  • Foldyna Martin
  • Ossikovski Razvigor
  • Garcia-Caurel Enric
  Thin Solid Films, Elsevier, 2008, 516, pp.1414.
• Design and characterisation of CaF2 and fused silica dual Fresnel rhombs as rotating compensators with optimal 132 degree retardation
  
  • Garcia-Caurel Enric
  • Stabo-Egg Frantz
  • Kildemo Morten
  Aplied Optics, 2008, 55, pp.2203.
• Dielectric properties of Ti2AlC and Ti2AlN MAX phases : the conductivity anisotropy
  
  • Haddad Noel
  • Garcia-Caurel Enric
  • Hultman L.
  • Barsoum M. W.
  • Hug Gilles
  Journal of Applied Physics, American Institute of Physics, 2008, 104, pp.023531.
• Strong orange/red electroluminescence from hydrogenated polymorphous silicon carbon light-emitting devices
  
  • Stenger I.
  • Abramov A.
  • Barthou Carlos
  • Nguyen-Tran Th.
  • Frigout A.
  • Roca I Cabarrocas Pere
  Applied Physics Letters, American Institute of Physics, 2008, 92, pp.241114. (10.1063/1.2948852)
  DOI : 10.1063/1.2948852
• ATOMIC HYDROGEN-DRIVEN SIZE CONTROL OF CATALYTIC NANOPARTICLES FOR SINGLE-WALLED CARBON NANOTUBE GROWTH
  
  • Jeong Hee J.
  • Eude Laurent
  • Gowtham M.
  • Marquardt Bernd
  • Lim Sung H.
  • Enouz Shaima M.
  • Cojocaru Costel Sorin
  • Park K.A.
  • Lee Young Hee
  • Pribat Didier
  Nano, World Scientific Publishing, 2008, 3 (3), pp.145-153. (10.1142/S1793292008000939)
  DOI : 10.1142/S1793292008000939
• Strutural properties of nitrogenated amorphous carbon films: influence of deposition temperature and radiofrequency discharge power
  
  • Lazar G.
  • Bouchet-Fabre B.
  • Zellama K.
  • Clin M.
  • Ballutaud D.
  • Godet C.
  Journal of Applied Physics, American Institute of Physics, 2008, 104, pp.073534. (10.1063/1.2951622)
  DOI : 10.1063/1.2951622
• Monitoring of critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller matrix polarimetry
  
  • Foldyna Martin
  • de Martino Antonello
  • Garcia-Caurel Enric
  • Ossikovski Razvigor
  • Bertin François
  • Hazart Jérôme
  • Postava Kamil
  • Drévillon Bernard
  Physica Status Solidi A (applications and materials science), Wiley, 2008, 205, pp.806.
• Silicon nanowires as negative electrode for lithium-ion microbatteries
  
  • Laik Barbara
  • Eude Laurent
  • Pereira-Ramos Jean Pierre
  • Cojocaru Costel Sorin
  • Pribat Didier
  • Rouvière Emmanuelle
  Electrochimica Acta, Elsevier, 2008, 53 (17), pp.5528--5532. (10.1016/j.electacta.2008.02.114)
  DOI : 10.1016/j.electacta.2008.02.114
• Controlled fabrication of patterned lateral porous alumina membranes
  
  • Gowtham Manoraham
  • Eude Laurent
  • Cojocaru Costel Sorin
  • Marquardt Berndt
  • Jeong Hee Jeen
  • Legagneux Pierre
  • Song Kim K
  • Pribat Didier
  Nanotechnology, Institute of Physics, 2008, 19, pp.035303. (10.1088/0957-4484/19/03/035303)
  DOI : 10.1088/0957-4484/19/03/035303
• Electronic state modification in laser deposited amorphous carbon films by the inclusion of nitrogen
  
  • Miyajima Yoji
  • Adamopoulos Georges
  • Henley S. J.
  • Stolojan V.
  • Tison Y.
  • Garcia-Caurel Enric
  • Drevillon Bernard
  • Shannon J.M.
  • Silva S.R.P.
  Journal of Applied Physics, American Institute of Physics, 2008, 104, pp.063701.
• Solid Phase Crystallized Silicon Thin Films Deposited by High Rate Electron Beam Evaporation: improvedstructural and electrical properties
  
  • Secouard C.
  • Ducros C.
  • Roca I Cabarrocas Pere
  • Duffar T.
  • Gorka B.
  • Fosca A.
  • Sanchette Frédéric
  , 2008, pp.xxx.
• Silane injection in a high-density low-pressure plasma system and its influence on the deposition kinetics and material properties of SiO2
  
  • Botha Roelene
  • Haj Ibrahim Bicher
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2008, pp.1115-1119.