Publications

1996

• Real time control of plasma deposited multilayers by multiwavelength ellipsometry
  
  • Kildemo M.
  • Bulkin Pavel
  • Deniau S.
  • Drévillon Bernard
  Applied Physics Letters, American Institute of Physics, 1996, pp.3395.
• Real time control of the growth of silicon alloy multilayers by multiwavelength ellipsometry
  
  • Kildemo M.
  • Deniau S.
  • Bulkin Pavel
  • Drévillon Bernard
  Thin Solid Films, Elsevier, 1996, pp.46-50.
• Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures
  
  • Kildemo M.
  • Deniau S.
  • Bulkin Pavel
  • Drévillon Bernard
  • Hunderi O.
  , 1996, pp.84.
• Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition
  
  • Bulkin Pavel
  • Swart P. L.
  • Lacquet B. M.
  • Chtcherbakov A. A.
  , 1996, pp.126.