Publications

2002

• An interfacial study of a a-C:H interlayer for the adhesion enhancement of plasma deposited silica thin films on polycarbonate
  
  • Hofrichter A.
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Adhesion Science and Technology, Taylor & Francis, 2002, pp.395-407.
• Ellipsometric method for real time control of thin deposition on imperfect substrates
  
  • Hofrichter A.
  • Heitz T.
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2002, pp.702.
• Plasma treatment of polycarbonate for improved adhesion
  
  • Hofrichter A.
  • Bulkin Pavel
  • Drévillon Bernard
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2002, pp.245-250.
• Application of Fourier transform infrared ellipsometry to assess the concentration of biological molecules
  
  • Garcia-Caurel Enric
  • Drevillon Bernard
  • Schwartz Laurent
  Applied optics, Optical Society of America, 2002, 41, pp.7339.
• Application of fourier-transform infrared ellipsometry to assess the concentration of biological molecules
  
  • Garcia-Caurel Enric
  • Drevillon Bernard
  • Schwartz Laurent
  Proceedings of SPIE, the International Society for Optical Engineering, SPIE, The International Society for Optical Engineering, 2002, Biomedical Vibrational Spectroscopy II, pp.132.
• Electrochemistry of Nitrogen-Incorporated Hydrogenated Amorphous Carbon Films
  
  • Cachet Hubert
  • Deslouis Claude
  • Chouiki M.
  • Saidani B.
  • Conway N.
  • Godet C.
  Journal of The Electrochemical Society, Electrochemical Society / IOPscience, 2002, 149 (7), pp.E233. (10.1149/1.1479160)
  DOI : 10.1149/1.1479160
• Ultraviolet phase modulated ellipsometry
  
  • Garcia-Caurel Enric
  • Moncel Jean-Luc
  • Bos Francis
  • Drevillon Bernard
  Review of Scientific Instruments, American Institute of Physics, 2002, 73, pp.4307.
• Direct numerical inversion method for kinetic ellipsometric data. II. Implementation and experimental verification
  
  • Hofrichter A.
  • Kouznetsov D.
  • Bulkin Pavel
  • Drévillon Bernard
  Applied optics, Optical Society of America, 2002, pp.4519.
• Deposition of silicon alloys in an integrated distributed electron cyclotron resonance reactor: oxide, nitride, oxinitrides and multilayers structures
  
  • Bulkin Pavel
  • Hofrichter A.
  • Heitz T.
  • Huc J.
  • Drévillon Bernard
  • Benattar J.J.
  Journal of Vacuum Science & Technology A, American Vacuum Society, 2002, pp.338.
• Atomic structure of the nanocrystalline Si particles appearing in nanostructured Si thin films produced in low-temperature radiofrequency plasmas
  
  • Viera Gregorio
  • Mikikian Maxime
  • Bertran Enric
  • Roca I Cabarrocas Pere
  • Boufendi Laifa
  Journal of Applied Physics, American Institute of Physics, 2002, 92 (8), pp.4684. (10.1063/1.1506382)
  DOI : 10.1063/1.1506382