Publications

2005

• Physico-Chimie des plasmas de silane pour la formation de nacocristaux de silicium a tempétature ambiante : application à des dispositifs.
  
  • Suendo Veinardi
  , 2005.
• Hydrogen storage by adsorption on activated carbon: experimental and numerical study
  
  • Hermosilla-Lara Guillaume
  • Momen Gelareh
  • Marty Philippe
  • Hassouni Khaled
  , 2005, pp.pas précise.
• Hopping current density in reversely biased crystalline silicon / amorphous carbon heterojunctions
  
  • Katsuno T.
  • Godet C.
  • Loir A.-S.
  • Garrelie Florence
  , 2006, 352 (9-20), pp.1421-1424. (10.1016/j.jnoncrysol.2005.09.038)
  DOI : 10.1016/j.jnoncrysol.2005.09.038
• Experimental and numerical study of the hydrogen's storage by adsorption on activated carbon
  
  • Hermosilla-Lara Guillaume
  • Hassouni Khaled
  • Marty Philippe
  • Momen Gelareh
  , 2005, pp.pas precisé.
• Conformal anodic oxidation of aluminum thin films
  
  • Cojocaru C. S.
  • Padovani J.M.
  • Wade T.
  • Mandoli C.
  • Jaskierowicz G.
  • Wegrowe J. -E.
  • Morral A.F.I.
  • Pribat Didier
  Nano Letters, American Chemical Society, 2005, 5 (4), pp.675-680. (10.1021/nl050079b)
  DOI : 10.1021/nl050079b
• FTIR ellipsometry device and process for characterization and further identification of samples of complex biological materials, notably micro-organisms
  
  • Garcia-Caurel Enric
  • Drevillon Bernard
  • Schwartz Laurent
  , 2005.
• Optical thin films deposition by MDECR-PECVD
  
  • Haj Ibrahim Bicher
  • Bulkin Pavel
  • Daineka D.
  • Drevillon Bernard
  , 2005, pp.59631Q.
• Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering
  
  • Bouchet-Fabre B.
  • Marino E.
  • Lazar G.
  • Zellama K.
  • Clin M.
  • Ballutaud D.
  • Abel F.
  • Godet C.
  Thin Solid Films, Elsevier, 2005, 482, Issues 1-2, pp.167-171. (10.1016/j.tsf.2004.11.166)
  DOI : 10.1016/j.tsf.2004.11.166
• Growth dynamics of hydrogenated silicon nanoparticles under realistic conditions of a plasma reactor
  
  • Vach H.
  • Brulin Q.
  • Chaâbane N.
  • Novikova T.
  • Roca I Cabarrocas Pere
  • Kalache B.
  • Hassouni K.
  • Botti Silvana
  • Reining Lucia
  Computational Materials Science, Elsevier, 2005, 35, pp.216-222. (10.1016/j.commatsci.2004.07.010)
  DOI : 10.1016/j.commatsci.2004.07.010
• Comparative study of the structure of a-CNx and a-CNx:H films using NEXAFS, XPS and FT-IR analysis
  
  • Bouchet-Fabre B.
  • Zellama K.
  • Godet C.
  • Ballutaud D.
  • Minéa T.
  Thin Solid Films, Elsevier, 2005, 482, Issues 1-2, pp.156-166. (10.1016/j.tsf.2004.11.134)
  DOI : 10.1016/j.tsf.2004.11.134
• Optical properties of high-density amorphous carbon films grown by nanosecond and femtosecond pulsed laser ablation
  
  • Katsuno Takashi
  • Godet Christian
  • Orlianges J.C.
  • Loir A.-S.
  • Garrelie Florence
  • Catherinot Alain
  Applied physics. A, Materials science & processing, Springer Verlag, 2005, 81 (31), pp.471-476. (10.1007/s00339-005-3257-6)
  DOI : 10.1007/s00339-005-3257-6
• Interface properties of a-Si:H/c-Si heterojunction solar cells from admittance spectroscopy
  
  • Gudovskikh A.S.
  • Kleider J.P.
  • Damon-Lacoste J.
  • Roca I Cabarrocas Pere
  • Veschetti Y.
  • Muller J.C.
  • Ribeyron P.J.
  • Rolland E.
  , 2005.
• Metrological applications of Mueller polarimetry in conical diffraction for overlay characterization in microelectronics
  
  • Novikova Tatiana
  • de Martino Antonello
  • Ossikovski Razvigor
  • Drevillon Bernard
  European Physical Journal: Applied Physics, EDP Sciences, 2005, 31, pp.63.
• About the efficiency limits of heterojunction solar cells
  
  • Damon-Lacoste J.
  • Roca I Cabarrocas Pere
  • Chatterjee P.
  • Veschetti Y.
  • Gudovskikh A.S.
  • Kleider J.P.
  • Ribeyron P.J.
  , 2005.